Effects of microstructure on microwave dielectric properties of Y2Ba(Cu1-xZnx)O5 solid solutions

Journal of the European Ceramic Society

Volumn 21, Issue 10-11, 2001, Pages 1699-1704

  Kan, Akinori ^a   Ogawa, Hirotaka ^a   Ohsato, Hitoshi ^b  

^a MEIJO UNIVERSITY   (Japan)

^b NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Dielectric properties; MgO; Powder; Solid state reaction; X ray method

Indexed keywords

GRAIN GROWTH; LATTICE CONSTANTS; MICROSTRUCTURE; MICROWAVES; SINTERING; SOLID SOLUTIONS;

SINTERING TIME;

DIELECTRIC MATERIALS;

CERAMICS;

EID: 0034883852     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(01)00097-8     Document Type: Article

References (6)

1. 5 (A = Y, Sm, Eu, Gd, Dy, Ho, Er, Yb)
2. 5 solid solutions
3. A profile refinement method for nuclear and magnetic structures
4. A dielectric resonator method of measuring inductive capacities in the millimeter range
5. Revised effective ionic radii and systematic studies of interatomic distances in halides and chalcogenides