Dielectric properties of Bi2(Zn1/3Nb2/3)2O7 thin films measured by fourier transform infrared spectroscopy

Journal of the European Ceramic Society

Volumn 21, Issue 10-11, 2001, Pages 1711-1714

  Chen, Yi Chun ^a   Liu, Hsiang Lin ^a   Cheng, Hsiu Fung ^a   Lin, I Nan ^b  

^a NATIONAL TAIWAN NORMAL UNIVERSITY   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Dielectric properties; Films; FTIR; Microwave ceramics

Indexed keywords

BISMUTH COMPOUNDS; CERAMIC MATERIALS; DIELECTRIC MATERIALS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PERMITTIVITY; PHONONS;

MICROWAVE FREQUENCY REGION;

THIN FILMS;

CERAMICS;

EID: 0034883474     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(01)00099-1     Document Type: Article

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