A method to calculate redundancy coverage for FLASH memories

Records of the IEEE International Workshop on Memory Technology, Design and Testing

Volumn , Issue , 2001, Pages 41-44

  Matarrese, S ^a   Fasoli, L ^a  

^a STMicroelectronics USA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; ITERATIVE METHODS; PROBABILITY; RANDOM PROCESSES; REDUNDANCY;

SENSE AMPLIFIERS;

PROM;

EID: 0034878377     PISSN: 10874852     EISSN: None     Source Type: Journal    
DOI: 10.1109/MTDT.2001.945226     Document Type: Article

References (2)