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Volumn 44, Issue 2, 2001, Pages 289-295
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Microrelief meter for field topography measurements
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Author keywords
Erosion; Instrumentation; Soil roughness; Surface topography
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Indexed keywords
DATA REDUCTION;
ERROR ANALYSIS;
IMAGE ANALYSIS;
OPTICAL RESOLVING POWER;
SURFACE TOPOGRAPHY;
MICRORELIEF METERS;
SOIL MECHANICS;
TOPOGRAPHY;
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EID: 0034876162
PISSN: 00012351
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (6)
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References (11)
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