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Volumn 63, Issue 4, 2001, Pages 252-263

Synchrotron X-ray computed microtomography: Studies on vesiculated basaltic rocks

Author keywords

Image analysis; Tomography; Vesicularity; Volcanlogy

Indexed keywords

BASALT; GEOMORPHOLOGY; PHYSICAL PROPERTY; TOMOGRAPHY; VESICLE; VOLCANOLOGY;

EID: 0034875767     PISSN: 02588900     EISSN: None     Source Type: Journal    
DOI: 10.1007/s004450100141     Document Type: Article
Times cited : (67)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.