Algorithms for pattern recognition in images of cell cultures

Proceedings of SPIE-The International Society for Optical Engineering

Volumn 4425, Issue , 2001, Pages 282-290

  Mendes, J M ^a   Peixoto, N L V ^a   Fernandez, F J R ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Processing and recognition of image; Technical vision

Indexed keywords

ALGORITHMS; CELL CULTURE; COMPUTER VISION; EDGE DETECTION; IMAGE PROCESSING; MICROELECTRODES; SILICON;

SILICON MICROSTRUCTURES;

MICROSTRUCTURE;

EID: 0034875076     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.429737     Document Type: Article

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