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Volumn 32, Issue 8, 2001, Pages 643-647
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Low-wavenumber Raman scattering spectroscopy in studies of new gallium-doped silica glass-based transparent vitroceramic medium
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Author keywords
[No Author keywords available]
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Indexed keywords
GALLIUM COMPOUNDS;
HEAT TREATMENT;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
RAMAN SCATTERING;
SILICA;
X RAY DIFFRACTION;
AMORPHOUS MATRICES;
DOPED SILICAS;
GLASS FUSION;
HEAT TREATMENT CONDITIONS;
NANOCRYSTAL GROWTH;
RAMAN SCATTERING SPECTROSCOPY;
SILICA-GLASS;
SIZE-DISTRIBUTION;
WAVE NUMBERS;
X-RAY DIFFRACTION MEASUREMENTS;
GLASS;
GALLIUM;
SILICON DIOXIDE;
ARTICLE;
CRYSTAL STRUCTURE;
MATERIALS;
MATERIALS TESTING;
RAMAN SPECTROMETRY;
STRUCTURE ANALYSIS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
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EID: 0034874441
PISSN: 03770486
EISSN: None
Source Type: Journal
DOI: 10.1002/jrs.708 Document Type: Article |
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Times cited : (6)
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References (18)
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