Signal to noise analysis of various imaging systems

Proceedings of SPIE- The International Society for Optical Engineering

Volumn 4259, Issue , 2001, Pages 16-21

  Miller, P J ^a   Harvey, A R ^a  

^a Cambridge Research & Instrumentation Inc   (United States)

Author keywords

Interferometry; Liquid crystal; Noise; Spectral imaging; Tunable filter

Indexed keywords

ELECTRIC FILTERS; ELECTRONS; INTERFEROMETERS; LIQUID CRYSTALS; POISSON DISTRIBUTION; SIGNAL TO NOISE RATIO; SPECTROMETERS; STATISTICAL METHODS;

IMAGING INTERFEROMETERS; POISSON STATISTICS; SPECTRAL IMAGING; TUNABLE FILTER;

IMAGING SYSTEMS;

EID: 0034872906     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.432495     Document Type: Article

References (2)

1. Signal to noise analysis of multiple color fluorescence imaging microscopy
2. Classification accuracy in multiple color fluorescence imaging microscopy