|
Volumn 2, Issue , 2001, Pages 1334-1339
|
The development of a new adaptive slicing algorithm for layered manufacturing system
a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
ALGORITHMS;
COMPUTER AIDED DESIGN;
COMPUTER SIMULATION;
CONTOUR MEASUREMENT;
LIQUID CRYSTAL DISPLAYS;
RAPID PROTOTYPING;
THICKNESS MEASUREMENT;
ADAPTIVES SLICING ALGORITHM;
LAYERED MANUFACTURING;
|
EID: 0034867105
PISSN: 10504729
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (16)
|
References (8)
|