Classification of microarray data with penalized logistic regression

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4266, Issue , 2001, Pages 187-198

  Eilers, P H C ^a   Boer, J M ^a   Van Ommen, G J ^a   Van Houwelingen, H C ^a  

^a LEIDEN UNIVERSITY MEDICAL CENTER   (Netherlands)

Author keywords

AIC; Cross validation; Generalized linear models; Genetic expression; Multicollinearity; Multivariate calibration; Ridge regression; Singular value decomposition

Indexed keywords

ARRAYS; COMPUTER SIMULATION; ESTIMATION; MATHEMATICAL MODELS; MATHEMATICAL TRANSFORMATIONS; MATRIX ALGEBRA; OPTIMIZATION; PROBABILITY; REGRESSION ANALYSIS;

AKAIKE INFORMATION CRITERION; LOGISTIC REGRESSION; MICROARRAY DATA; SINGULAR VALUE DECOMPOSITION;

DATA PROCESSING;

EID: 0034863834     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.427987     Document Type: Conference Paper

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