An efficient scanning pattern for layered manufacturing processes

Proceedings - IEEE International Conference on Robotics and Automation

Volumn 2, Issue , 2001, Pages 1340-1345

  Yang, Y ^a   Fuh, J Y H ^a   Loh, H T ^a   Wang, Y G ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Depth tree; Equidistant path; Rapid prototyping; Scanning pattern

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; SCANNING;

PATH GENERATION METHODS;

LAYERED MANUFACTURING;

EID: 0034859936     PISSN: 10504729     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. Application of the Taguchi method and new hatch styles for quality improvement in stereolithography
2. Polygon offsetting using a voronoi diagram and two stacks
3. Domain decomposition and surface filling curves in tool-path planning and generation
4. Implementation and evaluation of novel buildstyles in fused deposition modeling (FDM)
5. Deposition strategies and resulting part stiffnesses in fused deposition modeling