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Volumn , Issue , 2001, Pages 219-222
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Resistor matching characterization for process development using D/A converter
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALOG TO DIGITAL CONVERSION;
INTEGRATED CIRCUIT LAYOUT;
RESISTORS;
SCHEMATIC DIAGRAMS;
RESISTOR MISMATCH CHARACTERIZATION;
WAFER LEVEL TEST;
INTEGRATED CIRCUIT TESTING;
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EID: 0034859928
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (6)
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References (4)
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