Statistical modeling techniques: FPV vs. BPV

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2001, Pages 71-75

  Telang, N ^a   Higman, J M ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; MATHEMATICAL MODELS; MICROELECTRONICS; MOSFET DEVICES; OSCILLATORS (ELECTRONIC); STATISTICAL METHODS;

BACKWARD PROPAGATION OF VARIANCE; FORWARD PROPAGATION OF VARIANCE; RING OSCILLATOR;

INTEGRATED CIRCUIT LAYOUT;

EID: 0034859924     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. Statistical modeling for efficient parametric yield estimation of MOS VLSI circuits
2. Statistical circuit modeling