Implementation of an in vivo diode dosimetry program and changes in diode characteristics over a 4-year clinical history

Medical Physics

Volumn 28, Issue 8, 2001, Pages 1718-1726

  Jursinic, P A ^a  

^a MEDICAL COLLEGE OF WISCONSIN   (United States)

Author keywords

Diodes; In vivo dosimetry; Patient dose verification; Quality assurance; Semiconductor detector

Indexed keywords

DIODES; DOSIMETRY; QUALITY ASSURANCE; SEMICONDUCTOR DETECTORS; TEMPERATURE MEASUREMENT;

CLINICAL MEASUREMENTS; CONFIDENCE LEVELS; DIODE CHARACTERISTICS; IN-VIVO; N-TYPE SEMICONDUCTORS; PATIENT DOSE; PHANTOM MEASUREMENTS; TEMPERATURE CORRECTION;

SEMICONDUCTOR DIODES;

ARTICLE; CALCULATION; CALIBRATION; DIODE; DOSIMETRY; IN VIVO STUDY; MEASUREMENT; PRIORITY JOURNAL; TEMPERATURE MEASUREMENT; THERMISTOR; X RAY;

EID: 0034858227     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.1388217     Document Type: Article

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