Simulation studies of analog circuits fault approach based on self-organizing feature map neural networks

Xitong Fangzhen Xuebao/Acta Simulata Systematica Sinica

Volumn 13, Issue 5, 2001, Pages 582-584

  Ma, Ye ^a   Li, Nang ^a  

^a DALIAN NAVAL ACADEMY   (China)

Author keywords

Analog circuit; Fault diagnosis; Neural networks; Self organizing feature map

Indexed keywords

EID: 0034853305     PISSN: 1004731X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)