Stochastic testing of finite state machines

Proceedings of the American Control Conference

Volumn 6, Issue , 2001, Pages 4568-4573

  Hadjicostis, Christoforos N ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTRAINT THEORY; DIGITAL INTEGRATED CIRCUITS; DISTRIBUTED COMPUTER SYSTEMS; FAILURE ANALYSIS; FINITE AUTOMATA; INTEGRATED CIRCUIT TESTING; MARKOV PROCESSES; OBSERVABILITY; PERTURBATION TECHNIQUES; PROBABILITY DISTRIBUTIONS; SEQUENTIAL CIRCUITS; STATISTICAL METHODS;

FINITE STATE MACHINES; STATE TRANSITION FUNCTION; STOCHASTIC TESTING;

CONTROL SYSTEM ANALYSIS;

EID: 0034848021     PISSN: None     EISSN: None     Source Type: Journal    
DOI: 10.1109/ACC.2001.945699     Document Type: Article

References (10)

1. Fault and error models for VLSI
2. Principles and methods of testing finite state machines
3. Supervisory control of discrete-event processes with partial observations
4. Active diagnosis of discrete-event systems
5. A functional fault model for sequential machines