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Volumn 4347, Issue , 2001, Pages 324-335
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Calculation of relative damage thresholds for total internal reflection surfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC FIELD EFFECTS;
LIGHT REFLECTION;
PHASE SHIFT;
POLARIZATION;
TOTAL INTERNAL REFLECTION (TIR);
LASER DAMAGE;
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EID: 0034847673
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.425065 Document Type: Conference Paper |
Times cited : (10)
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References (14)
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