Confidence and curvature estimation of curvilinear structures in 3-D

Proceedings of the IEEE International Conference on Computer Vision

Volumn 2, Issue , 2001, Pages 139-144

  Bakker, P ^a   Van Vliet, L J ^a   Verbeek, P W ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; MATHEMATICAL MODELS; MATHEMATICAL TRANSFORMATIONS; SEISMOLOGY; SIGNAL TO NOISE RATIO; TENSORS; THREE DIMENSIONAL;

COORDINATE TRANSFORM; CURVILINEAR STRUCTURES; GRADIENT STRUCTURE TENSOR;

PATTERN RECOGNITION;

EID: 0034844741     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Analyzing oriented patterns
2. The application of a local dimensionality estimator to the analysis of 3d microscopic network structures
3. Representing local structure using tensors
4. Computing oriented texture fields
5. Improved curvature and anisotropy estimation for curved line bundles