STM study of surfaces of kish graphite doped by iron

Carbon

Volumn 39, Issue 13, 2001, Pages 1955-1962

  Bourelle, E ^a   Kaburagi, Y ^b   Hishiyama, Y ^b   Inagaki, M ^c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b TOKYO CITY UNIVERSITY   (Japan)

^c AICHI INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

A. kish graphite; B. doping; C. scanning tunneling microscopy; D. defects

Indexed keywords

DEFECTS; DOPING (ADDITIVES); HEAT TREATMENT; HIGH TEMPERATURE EFFECTS; SCANNING TUNNELING MICROSCOPY;

RESIDUAL RESISTIVITY RATIO (RRR);

GRAPHITE;

EID: 0034842344     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0008-6223(01)00004-5     Document Type: Article

References (19)