Novel scheme for reducing the pattern effect in 40 Gbps SOA based all-optical switch utilizing transparent CW assist light

Conference Proceedings - International Conference on Indium Phosphide and Related Materials

Volumn , Issue , 2001, Pages 174-177

  Tsurusawa, M ^a   Nishimura, K ^a   Usami, M ^a  

^a KDDI R AND D LABORATORIES INC   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; ERROR ANALYSIS; GAIN MEASUREMENT; LIGHT AMPLIFIERS; SENSITIVITY ANALYSIS; SIGNAL RECEIVERS;

PATTERN EFFECTS;

OPTICAL SWITCHES;

EID: 0034840584     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

1. 80Gbit/s all-optical regenerative wavelength conversion using semiconductor optical amplifier based interferometer
2. 100-Gbit/s bitwise logic
3. 168-Gb/s OTDM wavelength conversion using an SMZ-type all-optical switch
4. 168 Gbps error-free demultiplexing with hybrid-integrated symmetric Mach-Zehnder all-optical switch
5. All-optical 2R regeneration at 40 Gbit/s in an SOA-based Mach-Zehnder interferometer
6. Simultaneous all-optical add and drop multiplexing of 40 Gbit/s OTDM signals using monolithically integrated Mach-Zehnder interferometer
7. 40 Gb/s wavelength conversion in a cascade of an SOA and a NOLM and demonstration of extinction ration improvement
8. 40 Gbit/s all-optical wavelength converter and RZ-to-NRZ format adapter realized by monolithic integrated active Michelson interferometer
9. Semiconductor laser amplifiers for ultrafast all-optical signal processing
10. Mechanism for reducing recovery time of optical nonlinearity in semiconductor laser amplifier
11. Demonstration of optical noise reduction using nonlinear absorption in semiconductor laser amplifier
12. Gain recovery dynamics modeling and measurement in saturated semiconductor optical amplifiers