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Volumn 62, Issue 2-3, 2001, Pages 207-213

Calculating the spectral distribution of X-ray tubes with grounded cathode

Author keywords

Backscattered electrons; Spectral distribution; X Ray tube radiation

Indexed keywords

ANODES; BACKSCATTERING; CATHODES; SPECTRUM ANALYSIS; X RAY TUBES;

EID: 0034838646     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0969-806X(01)00202-X     Document Type: Article
Times cited : (9)

References (16)
  • 7
    • 84981772884 scopus 로고
    • Accurate description of surface ionization in electron probe microanalysis: An improved formulation
    • (1992) X-Ray Spectrom. , vol.21 , Issue.5 , pp. 229-238
    • Claude, M.1
  • 9
    • 84981770134 scopus 로고
    • Spectral distribution of X-ray produced by General Electric EA 75 Cr/W tube at various applied constant voltages
    • (1976) X-Ray Spectrom. , vol.5 , Issue.2 , pp. 104-114
    • Loomis, T.C.1    Keith, H.D.2
  • 15
    • 0012665024 scopus 로고
    • A comparative study of techniques for quantitative analysis of the X-ray spectra obtained with a Si(Li) detector
    • (1976) X-Ray Spectrom. , vol.5 , Issue.3 , pp. 154-167
    • Statham, P.J.1
  • 16
    • 84981769314 scopus 로고
    • Spectral intensity distributions from X-ray tubes. Calculated versus experimental evaluations
    • (1984) X-Ray Spectrom. , vol.13 , Issue.3 , pp. 134-141
    • Tertian, R.1    Broll, N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.