메뉴 건너뛰기




Volumn 80-81, Issue , 2001, Pages 187-192

Laser-crystallization of amorphous Si layers and two-dimensional simulations of the process dynamics

Author keywords

Finite differences method; Laser crystallisation; Simulation of melting; Simulation of solidification; Transmission electron microscopy (TEM)

Indexed keywords

COMPUTER SIMULATION; CRYSTALLIZATION; DYNAMICS; FINITE DIFFERENCE METHOD; LASER APPLICATIONS; MELTING; SOLIDIFICATION; STRUCTURE (COMPOSITION); TRANSMISSION ELECTRON MICROSCOPY; TWO DIMENSIONAL;

EID: 0034836714     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (11)
  • 10
    • 84902965889 scopus 로고
    • Borland Delphi, die deutsche bibliothek-CiP einheitsaufnahme
    • tewi Verlag
    • (1995)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.