A global optimization technique for microwave nondestructive evaluation

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 3, Issue , 2001, Pages 1916-1920

  Pastorino, M ^a   Caorsi, S ^a   Massa, A ^a  

^a UNIVERSITY OF GENOA   (Italy)

Author keywords

Imaging systems; Inversion techniques; Microwaves; Nondestructive evaluation

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; GENETIC ALGORITHMS; IMAGING SYSTEMS; MATHEMATICAL MODELS; MICROWAVES; NONDESTRUCTIVE EXAMINATION;

FLAW; INVERSION TECHNIQUES;

GLOBAL OPTIMIZATION;

EID: 0034836689     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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