Fault diagnosis in electronic circuits based on bilinear transformation in 3D and 4D space

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2001, Pages 55-58

  Czaja, Z ^a   Zielonko, R ^a  

^a GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Bilinear transformation; Fault localisation and identification

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; FAULT TOLERANT COMPUTER SYSTEMS; IDENTIFICATION (CONTROL SYSTEMS); INPUT OUTPUT PROGRAMS; MATHEMATICAL TRANSFORMATIONS; NEURAL NETWORKS;

BILINEAR TRANSFORMATIONS; FAULT DIAGNOSIS; INPUT OUTPUT DIAGNOSIS; MULTIDIMENSIONAL SPACE;

ELECTRIC NETWORK SYNTHESIS;

EID: 0034833316     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. Fault identification in electronic circuit with the aid of bilinear transformation
2. A fully automated measurement system for fault diagnosis of analog electronic circuits
3. The fault location algorithm based on two circuit functions
4. The method of electronic circuits diagnosis based on bilinear transformation in 3D space