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Volumn 17, Issue 1, 2001, Pages 121-136

A Bayesian approach to crack detection in electrically conducting media

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CRACKS; INVERSE PROBLEMS; MATHEMATICAL MODELS; SET THEORY; STATISTICAL METHODS;

EID: 0034832060     PISSN: 02665611     EISSN: None     Source Type: Journal    
DOI: 10.1088/0266-5611/17/1/310     Document Type: Article
Times cited : (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.