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Volumn 81, Issue 4, 2001, Pages 419-425

New electron backscatter correction factors for accurate skin depth dose calculation from skin contamination by hot particles

(1) Chibani, O a

a UNIVERSITY OF MARYLAND SCHOOL OF MEDICINE (United States)

Author keywords

Beta particles; Electrons; Hot particles; Scattering

Indexed keywords

ARTICLE; CLOTHING; DATA ANALYSIS; DOSIMETRY; ELECTRON; PRIORITY JOURNAL; RADIATION DOSE; RADIOACTIVE CONTAMINATION; SYSTEM ANALYSIS;

EID: 0034828769 PISSN: 00179078 EISSN: None Source Type: Journal
DOI: 10.1097/00004032-200110000-00006 Document Type: Article

Times cited : (4)

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