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Volumn 2, Issue , 2001, Pages 1288-1290

Dimensioning of open-ended coaxial probes for the dielectric characterization of thin-layered materials

Author keywords

Dielectric measurements; Open ended coaxial probes; Thin layer characterization

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; DIELECTRIC PROPERTIES; ELECTRIC ADMITTANCE; MATHEMATICAL MODELS; NUMERICAL METHODS; PROBES;

EID: 0034827483     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.