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Volumn 2, Issue , 2001, Pages 1288-1290
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Dimensioning of open-ended coaxial probes for the dielectric characterization of thin-layered materials
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Author keywords
Dielectric measurements; Open ended coaxial probes; Thin layer characterization
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Indexed keywords
APPROXIMATION THEORY;
COMPUTER SIMULATION;
DIELECTRIC PROPERTIES;
ELECTRIC ADMITTANCE;
MATHEMATICAL MODELS;
NUMERICAL METHODS;
PROBES;
DIELECTRIC MEASUREMENT;
DISCRETE ELEMENT MODEL;
FULL-WAVE ANALYSIS;
OPEN-ENDED COAXIAL CABLES;
QUASI-STATIC APPROXIMATION;
SPECTRAL DOMAIN ANALYSIS;
THIN LAYERED MATERIALS;
DIELECTRIC MATERIALS;
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EID: 0034827483
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (8)
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