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Volumn 2, Issue , 2001, Pages 950-954
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Dual-mode digital revolution counter
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Author keywords
Resolution; Revolution counter; Revolution measurement
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Indexed keywords
MEASUREMENT ERRORS;
MECHANICAL VARIABLES MEASUREMENT;
MICROCONTROLLERS;
OPTIMIZATION;
PARAMETER ESTIMATION;
REVOLUTION COUNTER;
REVOLUTION SPEED MEASUREMENT;
SPEED;
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EID: 0034827326
PISSN: None
EISSN: None
Source Type: Journal
DOI: 10.1109/IMTC.2001.928219 Document Type: Article |
Times cited : (5)
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References (3)
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