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Journal of the American Chemical Society

Volumn 123, Issue 23, 2001, Pages 5453-5459

Variable-temperature microcrystal X-ray diffraction studies of negative thermal expansion in the pure silica zeolite IFR

(4) Villaescusa, L A a Lightfoot, P a Teat, S J b Morris, R E a

a UNIVERSITY OF ST ANDREWS (United Kingdom)

b DARESBURY LABORATORY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

X-RAY SOURCES;

SILICA; SINGLE CRYSTALS; SYNCHROTRONS; THERMAL EFFECTS; THERMAL EXPANSION; X RAY DIFFRACTION ANALYSIS;

ZEOLITES;

SILICON DIOXIDE; ZEOLITE;

ARTICLE; CHEMICAL STRUCTURE; CORRELATION FUNCTION; CRYSTAL; CRYSTALLOGRAPHY; HEATING; SYNCHROTRON; TEMPERATURE; THERMAL ANALYSIS; X RAY DIFFRACTION;

EID: 0034826870 PISSN: 00027863 EISSN: None Source Type: Journal
DOI: 10.1021/ja015797o Document Type: Article

Times cited : (72)

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