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Physica C: Superconductivity and its Applications

Volumn 349, Issue 1-2, 2001, Pages 47-52

Possible application of bulk textured Bi:2223 for current limitation

(5) Noudem, J G a,b,c Bourgault, D a Barbut, J M b Tixador, P a Tournier, R a

a CNRS (France)

b SCHNEIDER ELECTRIC (France)

c ACCESS E V (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FAULT CURRENTS; ELECTRIC FIELD MEASUREMENT; LIMITERS;

FAULT CURRENT LIMITERS;

SUPERCONDUCTING MATERIALS;

EID: 0034826293 PISSN: 09214534 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-4534(00)01525-2 Document Type: Article

Times cited : (19)

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