Charge-carrier injection into CuPc thin films: A scanning tunneling microscopy study

Synthetic Metals

Volumn 122, Issue 1, 2001, Pages 73-77

  Alvarado, S F ^a   Rossi, L ^a   Muller P ^a   Riess W ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHARGE CARRIERS; COPPER COMPOUNDS; ENERGY GAP; FERMI LEVEL; GOLD; ORGANOMETALLICS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILMS; TRANSPORT PROPERTIES;

COPPER PHTHALOCYANINE;

SEMICONDUCTING FILMS;

EID: 0034825714     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(00)01372-2     Document Type: Article

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