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Volumn 39, Issue 4, 2001, Pages 432-438

Total-reflection X-ray diffraction study of friction-transferred poly(tetrafluoroethylene) film

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; FRICTION; POLYTETRAFLUOROETHYLENES; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0034825109     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/1099-0488(20010215)39:4<432::AID-POLB1015>3.0.CO;2-R     Document Type: Article
Times cited : (17)

References (28)
  • 3
    • 0001093980 scopus 로고
    • Steijn, R. P. Wear 1968, 12, 193-212.
    • (1968) Wear , vol.12 , pp. 193-212
    • Steijn, R.P.1
  • 23
    • 0343131947 scopus 로고    scopus 로고
    • note
    • In this TRXD system, the resolution of the inplane orientation distribution was estimated by the measurement of a perfect crystal, an Si single crystal. The resolution was about 0.2°, which was though to be due to a divergence of the Soller slit. This resolution was accurate enough to evaluate the orientational distribution of the PTFE film.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.