Phase transitions in excimer laser irradiated zirconia thin films

Applied Surface Science

Volumn 173, Issue 3-4, 2001, Pages 177-183

  Starbova, K ^a   Mankov, V ^a   Starbov, N ^a   Popov, D ^b   Nihtianova, D ^c   Kolev, K ^d   Laude, L D ^d  

^a CENTRAL LABORATORY OF PHOTOPROCESSES   (Bulgaria)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Bulgaria)

^c BULGARIAN ACADEMY OF SCIENCES   (Bulgaria)

^d UNIVERSITY OF MONS   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ELECTRON DIFFRACTION; EXCIMER LASERS; LASER BEAM EFFECTS; OPTICAL MICROSCOPY; PHASE TRANSITIONS; SURFACE TREATMENT; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

EXCIMER LASER MODIFICATION;

ZIRCONIA;

EID: 0034824824     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00830-8     Document Type: Article

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