Modelling, calibration and correction of nonlinear illumination-dependent fixed pattern noise in logarithmic CMOS image sensors

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 2001, Pages 1296-1301

  Joseph, D ^a   Collins, S ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

CMOS image sensors; Fixed pattern noise; Logarithmic pixels

Indexed keywords

CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; CURRENT VOLTAGE CHARACTERISTICS; LIGHT ABSORPTION; MATHEMATICAL MODELS; MATHEMATICAL TRANSFORMATIONS; NONLINEAR SYSTEMS; OPTIMIZATION; PHOTOCURRENTS; PHOTONS; SPURIOUS SIGNAL NOISE;

FIXED PATTERN NOISE; INTEGRATION-TIME CONTROL; LOGARITHMIC CMOS IMAGE SENSOR; LOGARITHMIC PIXEL;

IMAGE SENSORS;

EID: 0034822537     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. CMOS image sensors challenge CCDs
2. CMOS active pixel image sensors for highly integrated imaging systems
3. Inexpensive image sensors challenge CCD supremacy
4. Random addressable active pixel image sensors
5. Random addressable 2048 × 2048 active pixel image sensor
6. Wide-dynamic-range sensors
7. CMOS image sensor with logarithmic response and self calibrating fixed pattern noise correction