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Volumn 2, Issue , 2001, Pages 1079-1083

Calibration of thickness measurement instruments based on twin laser sensors. Isolines bilinear look up tables

Author keywords

Bilinear look up tables; Displacement laser sensors; Non contact thickness measuring; Twin sensor instrument calibration

Indexed keywords

APPROXIMATION THEORY; CALIBRATION; LASERS; PIECEWISE LINEAR TECHNIQUES; STAINLESS STEEL; STEEL SHEET; TABLE LOOKUP; THICKNESS MEASUREMENT;

EID: 0034822494     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (10)
  • 2
    • 0003517252 scopus 로고
    • Signal analysis
    • M.G. Hill International
    • (1984)
    • Papoulis, A.1
  • 3
    • 0003538029 scopus 로고    scopus 로고
    • Características Técnicas del Procesador de Señal K3TS. Cat. No. K3TS-E1-1
    • Omrom Electronics
  • 4
    • 0003538029 scopus 로고    scopus 로고
    • Características Técnicas del Medidor de Desplazamiento Láser Z4M. Cat. No. CATZ4M
    • Omrom Electronics
  • 5
    • 0003620699 scopus 로고    scopus 로고
    • Programm overview LXS laser sensors for contactless measurement
    • #205 - 7088 Venture Street. Delta, B.C. Canada V4G 1H5
    • Dynavision
  • 6
    • 0003707780 scopus 로고    scopus 로고
    • Specifications datasheet series 7000. 7M/11-96
    • 968 Albany-Shaker Road. Latham, NY 12110. USA
    • MTI Instruments


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.