Software aided failure analysis using ATPG tool

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2001, Pages 210-215

  Burmer, C ^a   Egger, P ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED ANALYSIS; COMPUTER AIDED DESIGN; COMPUTER AIDED SOFTWARE ENGINEERING; DATA COMPRESSION; DATA TRANSFER; FAILURE ANALYSIS; FLIP FLOP CIRCUITS; INTEGRATED CIRCUIT LAYOUT; LOGIC CIRCUITS; VECTORS;

AUTOMATIC TESTPATTERN GENERATION; FAULT DIAGNOSIS; SOFTWARE AIDED FAILURE ANALYSIS; SOFTWARE FAULT LOCALIZATION;

INTEGRATED CIRCUIT TESTING;

EID: 0034818877     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. Fault diagnosis on the ™S320C80(MVP) using FastScan™
2. Partial fault dictionary: A new approach for computer aided fault localisation
3. New techniques for logic fault diagnosis with a case study on the 440BX chipset