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Volumn 173, Issue 3-4, 2001, Pages 270-281

Surface morphology and electronic structure of Ge/Si(1 1 1) 7×7 system

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRONIC STRUCTURE; EPITAXIAL GROWTH; FILM GROWTH; MORPHOLOGY; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SUBSTRATES; SYNCHROTRON RADIATION; THERMAL EFFECTS;

EID: 0034817833     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00915-6     Document Type: Article
Times cited : (8)

References (34)
  • 29


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.