Failure contributors of MV electrical equipment and condition assessment program development

IEEE Conference Record of Annual Pulp and Paper Industry Technical Conference

Volumn , Issue , 2001, Pages 37-47

  Paoletti, Gabe ^a   Baier, Martin ^a  

^a Cutler Hammer Predictive Diagnostics ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONDITION MONITORING; DATA REDUCTION; ELECTRIC POWER TRANSMISSION; FAILURE ANALYSIS; PROGRAM DIAGNOSTICS;

MEDIUM VOLTAGE ELECTRIC EQUIPMENTS; RELIABILITY CENTRED MAINTENANCE (RCM);

ELECTRIC SWITCHGEAR;

EID: 0034798832     PISSN: 01902172     EISSN: None     Source Type: Journal    
DOI: 10.1109/PAPCON.2001.952946     Document Type: Article

References (4)