Estimation of errors in the measurement of unit-cell parameters. I. Statistical uncertainties of peak positions of powder diffraction lines determined by individual profile fitting

Journal of Applied Crystallography

Volumn 34, Issue 5, 2001, Pages 558-565

  Toraya, H ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ARTICLE; DIFFRACTION; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; MEASUREMENT; STATISTICS;

EID: 0034795743     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889801008676     Document Type: Article

References (21)

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