A JTAG based AC leakage self test

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue CIRCUITS SYMP., 2001, Pages 205-206

  Rahal Arabi, T ^a   Taylor, G ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE; INTEGRATED CIRCUIT TESTING; LEAKAGE CURRENTS; MICROPROCESSOR CHIPS; TRANSISTORS;

SILICON MANUFACTURING TECHNOLOGY;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0034785046     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. On the modeling of conductor and substrate losses in multi-conductor, multi-dielectric transmission line systems