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Volumn 17, Issue 1, 2001, Pages 29-30

Principle and process window of cerium dioxide thin film fabrication with dual plasma deposition

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[No Author keywords available]

Indexed keywords


EID: 0034784139     PISSN: 10050302     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (9)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.