Robust design of 0.18um ASIC MOSFETs using Taguchi method with TCAD

International Workshop on Statistical Metrology, Proceedings, IWSM

Volumn , Issue , 2001, Pages 21-24

  Kamohara, S ^a   Kawakami, M ^a   Kosaka, E ^a   Ito, F ^a   Okuyama, K ^a   Ohji, Y ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; OPTIMIZATION; SIGNAL TO NOISE RATIO;

TAGUCHI METHODS;

MOSFET DEVICES;

EID: 0034784097     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Application of statistical design and response surface methods to computer-aided VLSI device design II: Desirability functions and taguchi methods
2. Integrated circuit quality optimization using surface integrals
3. Device robust-design using multiple-response optimization technique
4. Statistical simulation, calibration and analysis of 0.25 CMOS technology