Reliability and performance of hierarchical RAID with multiple controllers

Proceedings of the Annual ACM Symposium on Principles of Distributed Computing

Volumn , Issue , 2001, Pages 246-254

  Baek, S H ^a   Kim, B W ^a   Joung, E J ^a   Park, C W ^a  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

Hierarchical RAID; High reliability; Markov process; Three failure tolerant array

Indexed keywords

COMPUTER ARCHITECTURE; MAGNETIC DISK STORAGE; MARKOV PROCESSES; MICROCONTROLLERS; PERFORMANCE; RELIABILITY;

MEAN TIME TO DATA LOSS; MULTIPLE CONTROLLERS; MULTIPLE DISK FAILURES; REDUNDANT ARRAYS OF INEXPENSIVE DISKS;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0034782651     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/383962.384036     Document Type: Conference Paper

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