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Theoretical and Applied Genetics

Volumn 103, Issue 5, 2001, Pages 797-803

Genetic mapping of gray leaf spot (GLS) resistance genes in maize

(5) Lehmensiek, A a Esterhuizen, A M b Van Staden, D a Nelson, S W b Retief, A E a

a STELLENBOSCH UNIVERSITY (South Africa)

b Sensako (South Africa)

Author keywords

AFLPs; Bulked segregant analysis; Gray leaf spot; Maize; QTL analysis

Indexed keywords

AMPLIFIED FRAGMENT LENGTH POLYMORPHISM; CHROMOSOMAL LOCALIZATION; DISEASE RESISTANCE; GENETIC VARIANCE; GRAY LEAF SPOT; INBRED LINE; MAIZE; PLANT BREEDING; PLANT GENETICS; QUANTITATIVE TRAIT LOCUS; RESTRICTION FRAGMENT LENGTH POLYMORPHISM;

BIOMARKERS; CROPS; GENES;

GENETIC MAPPING;

GENETIC ENGINEERING;

ZEA MAYS;

EID: 0034772945 PISSN: 00405752 EISSN: None Source Type: Journal
DOI: 10.1007/s001220100599 Document Type: Article

Times cited : (53)

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