Initial results with a point projection microscope

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4344, Issue , 2001, Pages 395-401

  Frost, B ^a   Joy, D ^a  

^a UNIVERSITY OF TENNESSEE   (United States)

Author keywords

In line holography; Nanotip field emitter; Off axis holography; Point reflection microscope

Indexed keywords

ELECTRIC POTENTIAL; ELECTRON REFLECTION; ELECTRON SOURCES; FOURIER OPTICS; HOLOGRAMS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

POINT REFLECTION MICROSCOPES;

ELECTRON HOLOGRAPHY;

EID: 0034764886     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.436765     Document Type: Conference Paper

References (8)

1. Point projector electron microscope
2. Mono-atomic tips for scanning tunneling microscopy
3. A new microscopic principle
4. Significance of electromagnetic potentials in the quantum theory