Generation of two-dimensional surface profiles from differential interference contrast (DIC) - Images

Optik (Jena)

Volumn 112, Issue 8, 2001, Pages 363-367

  Franz, G ^a   Kross, J ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Polished glass; Quantitative DIC Microscopy; Surface roughness

Indexed keywords

IMAGE ANALYSIS; LIGHT INTERFERENCE; OPTICAL BEAM SPLITTERS; OPTICAL GLASS; OPTICAL SYSTEMS; SURFACE ROUGHNESS;

DIFFERENTIAL INTERFERENCE CONTRAST (DIC) IMAGES;

IMAGING TECHNIQUES;

EID: 0034764531     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1078/0030-4026-00063     Document Type: Article

References (8)

1. Quantitative surface topography determination by Nomarski reflection microscopy. 1. Theory
2. Quantitative surface topography determination by Nomarski reflection microscopy. 2. Microscope modification, calibration, and planar sample experiments