Weighted oscillator strengths and lifetimes for the Si XI spectrum

Journal of Quantitative Spectroscopy and Radiative Transfer

Volumn 68, Issue 6, 2001, Pages 643-655

  Coutinho, L H ^a   Trigueiros, A G ^a,b  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b STATE UNIVERSITY OF RIO DE JANEIRO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ELECTRON ENERGY LEVELS; ELECTROSTATICS; LEAST SQUARES APPROXIMATIONS; SPECTROSCOPIC ANALYSIS;

HARTREE-FOCK RELATIVISTIC (HFR) APPROACH;

SILICON;

EID: 0034745372     PISSN: 00224073     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-4073(00)00048-0     Document Type: Article

References (25)

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2. Die Spektren von hochionisiertem Aluminium, Silicium und Schwefel
3. Grazing incidence spectra of Si XI and Si XII ions
4. Spectra of Mg IX, Al X, and Si XI isoelectronic with Be I
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6. Spectral line classification in the period between fluorine and silicon, of transitions between levels of principal quantum numbers 3 and 4
7. Recent progress in the classification of the spectra of highly ionized atoms
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9. Extreme ultraviolet spectra of highly stripped silicon ions
10. Identification of satellite lines in the X-ray-spectrum of foil-excited silicon
11. Energy levels of silicon, Si I through Si XIV
12. Atomic and ionic spectrum lines of hydrogen though krypton
13. Beam-foil spectroscopy of 2P-1S transitions in Si XI to Si XIV ions
14. Extended analysis of the spectrum Si XI - Compilation plus new measurements
15. Wavelengths, energy levels, and analysis of neutral atomic chlorine (CI I)
16. Atomic data for permitted resonance lines of atoms and ions from H to Si, and S, Ar, Ca and Fe
17. Weighted oscilla or strengths and lifetimes for the Si III spectrum
18. Weighted oscillator strengths and lifetimes for Si V spectrum
19. Weighted oscillator strengths and lifetimes for the Si VI spectrum
20. Weighted oscillator strengths and lifetimes for the Si VII spectrum
21. Weighted oscillator strengths and lifetimes for the Si IX spectrum