메뉴 건너뛰기




Volumn 34, Issue 1-6, 2001, Pages 237-240

Projectile fragmentation of silicon ions at 490 A MeV

Author keywords

Charge resolution; CR 39; Fragmentation cross sections; Siegen automatic measuring system

Indexed keywords

ETCHING; IONIZATION; IONS; IRRADIATION; RADIATION DETECTORS; TARGETS;

EID: 0034742319     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(01)00158-5     Document Type: Article
Times cited : (38)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.