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Volumn 34, Issue 1-6, 2001, Pages 237-240
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Projectile fragmentation of silicon ions at 490 A MeV
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Author keywords
Charge resolution; CR 39; Fragmentation cross sections; Siegen automatic measuring system
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Indexed keywords
ETCHING;
IONIZATION;
IONS;
IRRADIATION;
RADIATION DETECTORS;
TARGETS;
DATASETS;
ION FRAGMENTATION;
SILICON;
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EID: 0034742319
PISSN: 13504487
EISSN: None
Source Type: Journal
DOI: 10.1016/S1350-4487(01)00158-5 Document Type: Article |
Times cited : (38)
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References (9)
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