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Volumn 34, Issue 1-6, 2001, Pages 37-43
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Inter-comparison of geometrical track parameters and depth dependent track etch rates measured for li-7 ions in two types of cr-39
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Author keywords
[No Author keywords available]
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Indexed keywords
ALPHA PARTICLES;
COMPUTATIONAL GEOMETRY;
COMPUTER SIMULATION;
PARTICLE BEAM TRACKING;
RADIATION EFFECTS;
RATE CONSTANTS;
TRACK PARAMETERS;
PARTICLE DETECTORS;
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EID: 0034742286
PISSN: 13504487
EISSN: None
Source Type: Journal
DOI: 10.1016/S1350-4487(01)00117-2 Document Type: Article |
Times cited : (22)
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References (22)
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