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Volumn 34, Issue 1-6, 2001, Pages 37-43

Inter-comparison of geometrical track parameters and depth dependent track etch rates measured for li-7 ions in two types of cr-39

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; COMPUTATIONAL GEOMETRY; COMPUTER SIMULATION; PARTICLE BEAM TRACKING; RADIATION EFFECTS; RATE CONSTANTS;

EID: 0034742286     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(01)00117-2     Document Type: Article
Times cited : (22)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.