-
1
-
-
0001857520
-
-
(a) Wang, L.; Tao, L.; Xie, M.; Xu, G.; Huang, J.; Xu, Y. Catal. Lett. 1993, 21, 35-41.
-
(1993)
Catal. Lett.
, vol.21
, pp. 35-41
-
-
Wang, L.1
Tao, L.2
Xie, M.3
Xu, G.4
Huang, J.5
Xu, Y.6
-
3
-
-
0000566385
-
-
(a) Weckhuysen, B. M.; Wang, D.; Rosynek, M. P.; Lunsford, J. H. J. Catal. 1998, 175, 338-346.
-
(1998)
J. Catal.
, vol.175
, pp. 338-346
-
-
Weckhuysen, B.M.1
Wang, D.2
Rosynek, M.P.3
Lunsford, J.H.4
-
4
-
-
0000566384
-
-
(b) Weckhuysen, B. M.; Wang, D.; Rosynek, M. P.; Lunsford, J. H. J. Catal. 1998, 175, 347-351.
-
(1998)
J. Catal.
, vol.175
, pp. 347-351
-
-
Weckhuysen, B.M.1
Wang, D.2
Rosynek, M.P.3
Lunsford, J.H.4
-
5
-
-
0001279064
-
-
Lunsford, J. H.; Rosynek, M. P.; Wang, D. Stud. Surf. Sci. Catal. 1997, 107, 257-261.
-
(1997)
Stud. Surf. Sci. Catal.
, vol.107
, pp. 257-261
-
-
Lunsford, J.H.1
Rosynek, M.P.2
Wang, D.3
-
6
-
-
0001278149
-
-
Solymosi, F.; Cserenyi, J.; Szoke, A.; Bansagi, T.; Oszko, A. J. Catal. 1997, 165, 150-161.
-
(1997)
J. Catal.
, vol.165
, pp. 150-161
-
-
Solymosi, F.1
Cserenyi, J.2
Szoke, A.3
Bansagi, T.4
Oszko, A.5
-
7
-
-
0001086484
-
-
Solymosi, F.; Szoke, A.; Cserenyi, J. Catal. Lett. 1996, 39, 157-161.
-
(1996)
Catal. Lett.
, vol.39
, pp. 157-161
-
-
Solymosi, F.1
Szoke, A.2
Cserenyi, J.3
-
8
-
-
0010256203
-
-
Wong, S.-T.; Xu, Y.; Liu, W.; Wang, L.; Guo, X. Appl. Catal., A 1996, 136, 7-17.
-
(1996)
Appl. Catal., A
, vol.136
, pp. 7-17
-
-
Wong, S.-T.1
Xu, Y.2
Liu, W.3
Wang, L.4
Guo, X.5
-
9
-
-
0031048611
-
-
Choudhary, V. R.; Kinage, A. K.; Choudhary, T. V. Science 1997, 275, 1286-1288.
-
(1997)
Science
, vol.275
, pp. 1286-1288
-
-
Choudhary, V.R.1
Kinage, A.K.2
Choudhary, T.V.3
-
10
-
-
0000730342
-
-
Wang, D.; Lunsford, J. H.; Rosynek, M. P. J. Catal. 1997, 169, 347-358.
-
(1997)
J. Catal.
, vol.169
, pp. 347-358
-
-
Wang, D.1
Lunsford, J.H.2
Rosynek, M.P.3
-
11
-
-
0029973050
-
-
Hyeon, T.; Fang, M.; Suslick, K. S. J. Am. Chem. Soc. 1996, 118, 5492-5493.
-
(1996)
J. Am. Chem. Soc.
, vol.118
, pp. 5492-5493
-
-
Hyeon, T.1
Fang, M.2
Suslick, K.S.3
-
13
-
-
0004171543
-
-
Kluwer Academic Publishers: Dordrecht
-
(b) Crum, L. A.; Mason, T. J.; Reisse, J. L.; Suslick, K. S., Eds. Sonochemistry and Sonoluminescence; Kluwer Academic Publishers: Dordrecht, 1999.
-
(1999)
Sonochemistry and Sonoluminescence
-
-
Crum, L.A.1
Mason, T.J.2
Reisse, J.L.3
Suslick, K.S.4
-
14
-
-
0000984909
-
-
Ertl, G., Knozinger, H., Weitkamp, J., Eds.; Wiley-VCH: Weinheim, Chapter 8.6
-
Suslick, K. S. In Handbook of Heterogeneous Catalysis; Ertl, G., Knozinger, H., Weitkamp, J., Eds.; Wiley-VCH: Weinheim, 1997; Vol. 3, Chapter 8.6, pp 1350-1357.
-
(1997)
Handbook of Heterogeneous Catalysis
, vol.3
, pp. 1350-1357
-
-
Suslick, K.S.1
-
15
-
-
0033592670
-
-
(a) McNamara, W. B., III; Didenko, Y.; Suslick, K. S. Nature 1999, 401, 772-776.
-
(1999)
Nature
, vol.401
, pp. 772-776
-
-
McNamara W.B. III1
Didenko, Y.2
Suslick, K.S.3
-
17
-
-
0342376080
-
-
note
-
At 20 kHz, the cavitation bubble will be on the order of 100 μm in size, and much too large to occur within the nm pores of a zeolite.
-
-
-
-
18
-
-
0342811023
-
-
note
-
6 and given identical posttreatment and compared to the above material.
-
-
-
-
19
-
-
0342811024
-
-
note
-
Scanning transmission electron microscopy (STEM) utilized a VG HB501 microscope with EDX detection (Oxford Instruments). Long exposure to the electron beam must be avoided for zeolite samples to avoid sample degradation during STEM.
-
-
-
-
21
-
-
0343681292
-
-
note
-
2C particles (≈2 nm) all supported on uniformly coated particles of ZSM-5.
-
-
-
-
22
-
-
0343681291
-
-
John Wiley & Sons: Chichester
-
(a) X-ray photoelectron spectroscopy vas recorded on a Phi-540 Perkin-Elmer spectrometer using Mg Kα radiation. The XPS was internally calibrated to the known Si (2p) peak at 102.9 eV in ZSM-5; Briggs, D. Practical Surface Analysis, 2nd ed.; John Wiley & Sons: Chichester, 1990; Vol. 1, pp 407-413.
-
(1990)
Practical Surface Analysis, 2nd Ed.
, vol.1
, pp. 407-413
-
-
Briggs, D.1
-
23
-
-
0003459529
-
-
Chastain J., Ed.; Perkin-Elmer: Eden Prairie, MN
-
3/2) peaks are at 228.6 and 231.7 eV, internally calibrated to the background C(1s) peak at 283.5 eV: Moulder J. F.; Stickle, W. F.; Sobol, P. E.; Bomben, K. D. Handbook of X-ray Photoelectron Spectroscopy; Chastain J., Ed.; Perkin-Elmer: Eden Prairie, MN, 1992.
-
(1992)
Handbook of X-ray Photoelectron Spectroscopy
-
-
Moulder, J.F.1
Stickle, W.F.2
Sobol, P.E.3
Bomben, K.D.4
-
24
-
-
0343245700
-
-
note
-
XPS analysis of both the O(1s) and Si(2p) in the HZSM-5 and the HZSM-5 control sample gave an O/Si atomic ratio of 2.1, as expected.
-
-
-
-
26
-
-
0032515428
-
-
Humblot, F.; Didillon, D.; Lepeltier, F.; Candy, J. P.; Corker, J.; Clause, O.; Bayard, F.; Basset, J. M. J. Am. Chem. Soc. 1998, 120, 137-146.
-
(1998)
J. Am. Chem. Soc.
, vol.120
, pp. 137-146
-
-
Humblot, F.1
Didillon, D.2
Lepeltier, F.3
Candy, J.P.4
Corker, J.5
Clause, O.6
Bayard, F.7
Basset, J.M.8
-
27
-
-
27844520033
-
-
Lee, J. S.; Lee, K. H.; Lee, J. Y. J. Phys. Chem. 1992, 96, 362-366.
-
(1992)
J. Phys. Chem.
, vol.96
, pp. 362-366
-
-
Lee, J.S.1
Lee, K.H.2
Lee, J.Y.3
-
28
-
-
0342376079
-
-
note
-
3/min. The reaction products were analyzed with a quadrupole mass spectrometer (Spectral Instruments) and gas chromatograph (Hewlett-Packard) with an n-octane/Porasil C column and FID.
-
-
-
|